high7.8
CVE-2024-45573
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Impact
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Affected products
| Vendor | Product | Affected versions |
|---|---|---|
| Qualcomm | Fastconnect 6700 Firmware | All versions |
| Qualcomm | Fastconnect 6900 Firmware | All versions |
| Qualcomm | Fastconnect 7800 Firmware | All versions |
| Qualcomm | Qcm5430 Firmware | All versions |
| Qualcomm | Qcm6490 Firmware | All versions |
| Qualcomm | Qcs5430 Firmware | All versions |
| Qualcomm | Qcs6490 Firmware | All versions |
| Qualcomm | Video Collaboration Vc3 Platform Firmware | All versions |
| Qualcomm | Sc8380xp Firmware | All versions |
| Qualcomm | Sdm429w Firmware | All versions |
| Qualcomm | Snapdragon 429 Mobile Firmware | All versions |
| Qualcomm | Snapdragon 7c\+ Gen 3 Compute Firmware | All versions |