medium6.6
CVE-2024-53017
Memory corruption while handling test pattern generator IOCTL command.
Impact
Memory corruption while handling test pattern generator IOCTL command.
Affected products
| Vendor | Product | Affected versions |
|---|---|---|
| Qualcomm | Sdm429w Firmware | All versions |
| Qualcomm | Snapdragon 429 Mobile Platform Firmware | All versions |
| Qualcomm | Wcn3620 Firmware | All versions |
| Qualcomm | Wcn3660b Firmware | All versions |