high7.5
CVE-2025-47318
Transient DOS while parsing the EPTM test control message to get the test pattern.
Impact
Transient DOS while parsing the EPTM test control message to get the test pattern.
Affected products
| Vendor | Product | Affected versions |
|---|---|---|
| Qualcomm | Apq8017 Firmware | All versions |
| Qualcomm | Apq8064au Firmware | All versions |
| Qualcomm | Aqt1000 Firmware | All versions |
| Qualcomm | Ar8031 Firmware | All versions |
| Qualcomm | Ar8035 Firmware | All versions |
| Qualcomm | Qca6584 Firmware | All versions |
| Qualcomm | Qca6584au Firmware | All versions |
| Qualcomm | Qca6595 Firmware | All versions |
| Qualcomm | Qca6595au Firmware | All versions |
| Qualcomm | Qca6678aq Firmware | All versions |
| Qualcomm | Qca6688aq Firmware | All versions |
| Qualcomm | Qca6696 Firmware | All versions |