high8.6
CVE-2025-9709
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor n…
Impact
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
Affected packages
This record carries no package version data, so it cannot be matched against a dependency list automatically. Read the advisory and compare your version by hand.
Weakness classification
References
- NVD record
- CVE.org record
- https://nvd.nist.gov/vuln/detail/CVE-2020-27211
- https://raelize.com/upload/research/2022/No_Hat_2022_-_Glitching_devices_for_code_execution_v1.1.pdf
- https://raelize.com/upload/research/2025/Dartmouth_202505_False-Injections-Tales-of-Physics-Misconceptions-and-Weird-Machines_v1.1.pdf
- https://www.toreon.com/cve-2025-9709-major-vulnerability-in-common-chip/